Location: Ghaziabad, India
Member since: April 2012
Our company is working for us from last 47 years and we have enough experience to work with you guys.
Indian Institute of Technology, Guwahati
Indian School of Business
College of Engineering Pune
Microsoft Certified Solutions Expert (MCSE) certifications are designed to recognize IT professionals who can design and build solutions across multiple technologies, both on-premise and in the cloud.<br /><br />Previous versions of this certification were called Microsoft Certified Systems Engineer and demonstrated the ability to design and implement Windows Sever 2003 (and earlier) infrastructures.
Microsoft Certified Solutions Associate (MCSA) certifications validate the core technical skills required to build a sustainable career in IT. MCSA opens the door to multiple career paths and is a requirement for MCSE certifications.<br /><br />Previous versions of this certification were called Microsoft Certified Systems Administrator and demonstrated the ability to administrate network and systems environments running Windows Sever 2003 (and earlier).
Microsoft Certified IT Professional (MCITP) certifications recognize IT professionals who demonstrate skills in planning, deploying, supporting, maintaining, and optimizing IT infrastructures.
Microsoft Certified Technology Specialist (MCTS) certifications help IT professionals target specific technologies and distinguish themselves by demonstrating in-depth knowledge and expertise.
J.-O. Haenni. Architecture EPIC et jeux d'instructions multimdias pour applications cryptographiques. PhD thesis number 2540, Swiss Federal Institute of Technology, Lausanne, Switzerland, 2002.
J.-L. Beuchat, J.-O. Haenni, H. F. Restrepo, C. Teuscher, F. J. Gomez, and E. Sanchez. Approches matrielles et logicielles de l'algorithme de chiffrement IDEA. "Technique et science informatiques", No. 02/2002.<br /><br />J.-L. Beuchat and J.-O. Haenni. Von Neumann's 29-state cellular automaton: a hardware implementation. "IEEE Transactions on Education", Vol. 43, No. 3, August 2000, pp. 300-308. (pdf*)<br /><br />E. Sanchez, M. Sipper, J.-O. Haenni, J.-L. Beuchat, A. Stauffer, and A. Pe