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@pbobek
Flag of Poland Gliwice, Poland
Member since June, 2012
3 Recommendations

Piotr Bidzinski - tael.pl 

I am full of ideas and ready to accept challenges, I always try to meet my clients standards and go beyond them. Each freelance project is unique and important for me. I design, develop and program websites. Managing every project from the concept to the finished product. I am able to build every site from scratch creating best individual applications for my clients, using following technologies: XHTML, CSS, PHP, MySQL, JAVA Script and AJAX. In short, I can make anything that you can find in the web. I work with content management systems (CMS): - WordPress, - Joomla, - PrestaShop. In my work, I want to help small and medium businesses to develop their websites, marketing strategies and branding. Simply put, I want to make beautiful websites for people with creative ideas.
$20 USD/hr
45 Reviews
5.4
  • 88%Jobs Completed
  • 100%On Budget
  • 100%On Time
  • 37%Repeat Hire Rate

Recent Reviews

Experience

Owner/Website developer

Dec 2012

My own firm:

Education

Masters

2003 - 2008 (5 years)

PhD studies

2008 - 2012 (4 years)

Certifications

NI Certified LabVIEW Associate Developer (CLAD) (2011)

National Instruments

form : Entry-level LabVIEW certification Demonstrates a broad understanding of LabVIEW core features and functionality Shows ability to read and interpret existing LabVIEW code Valid for 2 years from date taken, recertification required to maintain credentials Benefits include use of certification logo and listing on The NI Certified LabVIEW Associate Developer is the first step in the three-part NI LabVIEW certification process. It indicates a broad working knowledge of the LabVIEW environment, a basic understanding of coding and documentation best practices, and the ability to read and interpret existing code. You can use this certification to assess and validate an individual’s LabVIEW development skills for the purpose of project staffing or career advancement. Recommended Experience Level - Six or more months of LabVIEW development experience OR - LabVIEW Core 1 and 2 training with three or more months of LabVIEW development experience Exam Details - Prerequisite: None - Format: Multiple choice - Duration: One hour - Location: Pearson VUE testing centers or NI branch offices Recertification Exam Details - Recertification Interval: 2 years - Format: Multiple choice - Duration: One hour - Location: Pearson VUE testing centers or NI branch offices

Publications

Analysis of chemical shifts in Auger electron spectra versus sputtering time from passivated surfaces

1. A. Domanowska, B. Adamowicz, P. Bidziński, A. Klimasek, J. Szewczenko, T. Gutt, H. Przewłocki, Analysis of chemical shifts in Auger electron spectra versus sputtering time from passivated surfaces, Optica Applicata, Vol. 41, No. 2 (2011) 441-447 (impact factor )

The influence of interface states and bulk carrier lifetime on the minority carrier behavior in an illuminated metal/insulator/GaN structure

2. M. Miczek, P. Bidziński, B. Adamowicz, C. Mizue, T. Hashizume Elsevier The influence of interface states and bulk carrier lifetime on the minority carrier behavior in an illuminated metal/insulator/GaN structure, Solid State Communications, Vol. 151, No. 11 (2011) 830-833 (impact factor )

Impact of Interface States and Bulk Carrier Lifetime on Photocapacitance of Metal/Insulator/GaN Structure for Ultraviolet Light Detection

P. Bidzinski, M. Miczek, B. Adamowicz, C. Mizue, T. Hashizume Japan Society of Applied Physics Impact of Interface States and Bulk Carrier Lifetime on Photocapacitance of Metal/Insulator/GaN Structure for Ultraviolet Light Detection, Japanese Journal of Applied Physics, Vol. 50, No. 4 (2011) 04DF08 (impact factor )

Capacitance-voltage andAuger chemical profile studies on AlGaN/GaN structures passivated by SiO2/Si3N4 and SiNx/Si3N4 bilayers

B. Adamowicz, M. Miczek, T. Hashizume, A. Klimasek, P. Bobek, J. Żywicki: Capacitance-voltage andAuger chemical profile studies on AlGaN/GaN structures passivated by SiO2/Si3N4 and SiNx/Si3N4 bilayers, Optica Applicata 37 (2007) 327-334.(imact factor )